X-ray perfection study of Pb0.8Sn0.2Te crystals grown by the bridgman method
✍ Scribed by U. Pietsch; Dr. M. Mühlberg; Dr. H. Berger
- Publisher
- John Wiley and Sons
- Year
- 1980
- Tongue
- English
- Weight
- 163 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## X-ray Study of the Component Distribution in Mould-grown Biloo4Sb, Crystals Morild growing (a modified version of Bridgnian technique) is a suitable niethod for growing crystals with given shape and orientation (CHAIKIN et al.). Usually the inonld-grown crystals are plates with a thickness of 1
## Abstract A dislocation density dependence on crystal transverse dimensions has been investigated for crystals of Sb grown in split graphite moulds at rates of 1.5; 8.5 and 15 cm/h. The dependence is shown to be the same for all growth rates which agrees with an earlier suggested theoretical equa
Thermal conditions and rotation rate were examined experimentally for obtaining a flat interface growth of high melting-point oxide (Tb 3 Sc x Al 5-x O 12 -TSAG) by the Czochralski method. The critical crystal rotation rate can be significantly reduced, of about twice at low and very low temperature