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X-ray studies of misfit dislocations in the interface of epitaxial Nb films on sapphire

✍ Scribed by Lee, C.H.; Liang, K.S.

Book ID: 122416182
Publisher: Elsevier Science
Year: 1992
Weight: 383 KB
Volume: 40
Category: Article
ISSN: 0956-7151
DOI: 10.1016/0956-7151(92)90274-I

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