Bragg and Laue x-ray diffraction study of dislocations in thick hydride vapor phase epitaxy GaN films

✍ Scribed by Ratnikov, V.; Kyutt, R.; Shubina, T.; Paskova, T.; Valcheva, E.; Monemar, B.

• Book ID: 121470592
• Publisher: American Institute of Physics
• Year: 2000
• Tongue: English
• Weight: 504 KB
• Volume: 88
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1321021