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X-ray studies of dislocations in multi-layer Cu films

✍ Scribed by S. Zwui; S. Li; H. Guan

Book ID: 105106120
Publisher: Springer
Year: 1986
Tongue: English
Weight: 147 KB
Volume: 39
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf01177165

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consists of a central initiation site caused during the high-voltage collapse and a surrounding dendritic etching caused after the voltage collapse. Energy dispersive analysis of the central region shows that when contaminants are observed they are dielectric. Dielectric particles above 10 , ~L diam