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X-ray specular reflectivity of the 4He liquid-vapor interface

✍ Scribed by L.B. Lurio; T.A. Rabedeau; P.S. Pershan; Isaac F. Silvera

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
157 KB
Volume
169
Category
Article
ISSN
0921-4526

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✦ Synopsis

X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures.

The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported.

πŸ“œ SIMILAR VOLUMES

The influence of specular interface refl
The influence of specular interface reflection on grazing incidence X-ray diffraction and diffuse scattering from superlattices
✍ G.T. Baumbach; V. Holy; U. Pietsch; M. Gailhanou πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 247 KB

Superlattices (SL) with a large difference in the refractive index between the alternating layers give rise to specular reflection from the intrinsic interfaces of the SL which proves very efficient for small incident or exit angles near the critical angle of total external reflection. This influenc