Synchrotron x-ray studies of liquid-vapor interfaces
β Scribed by J. Als-Nielsen
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 615 KB
- Volume
- 140
- Category
- Article
- ISSN
- 0378-4371
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π SIMILAR VOLUMES
X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported.
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