𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Synchrotron x-ray studies of liquid-vapor interfaces

✍ Scribed by J. Als-Nielsen


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
615 KB
Volume
140
Category
Article
ISSN
0378-4371

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


X-ray specular reflectivity of the 4He l
✍ L.B. Lurio; T.A. Rabedeau; P.S. Pershan; Isaac F. Silvera πŸ“‚ Article πŸ“… 1991 πŸ› Elsevier Science 🌐 English βš– 157 KB

X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the 4He liquid-vapor interface are reported.

ChemInform Abstract: X-Ray Synchrotron R
✍ Ya. V. Zubavichus; Yu. L. Slovokhotov πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons βš– 23 KB πŸ‘ 2 views

## Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a β€œFull Text” option. The original article is trackable v