X-ray spectrometric applications of a synchrotron x-ray microbeam

✍ Scribed by Atsuo Iida

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 371 KB
• Volume: 26
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/(sici)1097-4539(199711/12)26:6<359::aid-xrs234>3.0.co;2-l

✦ Synopsis

Synchrotron x-ray microbeams with less than a few lm spatial resolution have been applied to x-ray spectroscopic and di †raction studies. Among various x-ray spectrometric applications, the relatively new techniques of nearsurface x-ray Ñuorescence analysis and the micro x-ray absorption Ðne structure (micro-XAFS) method have been developed. For a near-surface analysis, the grazing-exit condition is used to enhance the surface sensitivity in addition to the lateral spatial resolution. With the micro-XAFS technique, chemical-state analysis over small regions and chemical-state imaging become possible. A micro x-ray spectrometric analysis with high spatial resolution was e †ectively utilized for materials characterization.