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X-ray scattering studies of semiconductor interfaces: Atomic structure and morphology

✍ Scribed by E. Vlieg; J.F. van der Veen

Book ID: 107925703
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 704 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90034-2

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