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X-ray scattering studies of metal and semiconductor surfaces

✍ Scribed by Simon GJ Mochrie

Book ID: 117757143
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 540 KB
Volume: 3
Category: Article
ISSN: 1359-0286
DOI: 10.1016/s1359-0286(98)80007-7

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