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Structural studies of metal-semiconductor interfaces by means of surface extended X-ray absorption edge fine structure

✍ Scribed by J. Stöhr; R. Jaeger; T. Kendelewicz; G. Rossi; I. Lindau


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
50 KB
Volume
104
Category
Article
ISSN
0040-6090

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