A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semic
X-Ray Scattering from Semiconductors (2nd Edition)
โ Scribed by Paul F. Fewster
- Publisher
- Imperial College Pr
- Year
- 2003
- Tongue
- English
- Leaves
- 316
- Edition
- 2
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of material
<p>This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that
<p><P>This monograph represents a critical survey of the outstanding capabilities of X-ray <BR>diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particula