Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of material
โฆ LIBER โฆ
๐
The Scattering of X-Rays from Gases
โ Scribed by C. S Barrett
- Publisher
- IBM.Com/Redbooks
- Year
- 1928
- Tongue
- English
- Leaves
- 4
- Category
- Library
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