𝔖 Bobbio Scriptorium

✦ LIBER ✦

X-ray residual stress measurement in TiN, ZrN and HfN films using the Seemann-Bohlin method

✍ Scribed by Anthony J. Perry; Václav Valvoda; David Rafaja

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 448 KB
Volume: 214
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(92)90766-5

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Residual stress in coated low-Z films oF

Residual stress in coated low-Z films oF TiC and TiN: I. Stress measurement by use of X-ray diffractometry

✍ Isao Yoshizawa; Kohji Kamada 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 461 KB

The determination of lattice parameters

The determination of lattice parameters and strains in stressed thin films using X-ray diffraction with Seeman-Bohlin focusing

✍ E.L Haase 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 426 KB

The relationship between residual stress

The relationship between residual stress, X-ray elastic constants and lattice parameters in TiN films made by physical vapor deposition

✍ A.J. Perry 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 399 KB

Measurement of residual stresses in carb

Measurement of residual stresses in carbon fibre/resin composite materials using X-ray diffraction : Fenn, R.H. Composites evaluation. Proceedings of the 2nd international conference on testing, evaluation and quality control of composites-TEQC 87, Guildford (United Kingdom), 22–24 Sep. 1987. pp. 146–152. Edited by J. Herriot. Butterworths, 1987

📂 Article 📅 1989 🏛 Elsevier Science ⚖ 175 KB