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X-ray research of polycrystals. X-ray diffraction methods for precision determinations of polycrystal lattice parameters over unsolved double lines

✍ Scribed by G. V. Davydov; V. P. Dzekanovskaya; N. A. Erokhov

Book ID: 112699247
Publisher: Springer
Year: 1968
Tongue: English
Weight: 109 KB
Volume: 24
Category: Article
ISSN: 1420-682X
DOI: 10.1007/bf02138288

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📜 SIMILAR VOLUMES

Contribution to the X-ray diffraction me

Contribution to the X-ray diffraction methods for precision determinations of polycrystal lattice parameters

✍ G. V. Davydov; V. P. Dzekanovskaya; N. A. Erokhov 📂 Article 📅 1967 🏛 Springer 🌐 English ⚖ 610 KB

X-ray research for polycrystals. The for

X-ray research for polycrystals. The formation geometry of instrumental width of the diffractional line at the investigation of the polycrystals in the translucent X-rays

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Application of a precise double X-ray sp

Application of a precise double X-ray spectrometer for accurate lattice parameter determination

✍ Godwod, K. ;Kowalczyk, R. ;Szmid, Z. 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 393 KB

X-ray research of polycrystals. The meth

X-ray research of polycrystals. The methods for approximation at determination of the real width of X-ray interferentional lines with the application of a standard-sample

✍ N. A. Erokhov; J. P. Vyrodov; G. V. Davydov 📂 Article 📅 1968 🏛 Springer 🌐 English ⚖ 202 KB

Dependence of Calculated Lattice Paramet

Dependence of Calculated Lattice Parameters and Geometry of the Formation of X-Ray Diffraction Lines on the Characteristics of the Varied Lattice of the Polycrystal

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Peak Position Determination of X-Ray Dif

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The possibilities and limits of the polynomial approximation for an accurate determination of the peak position of X-ray diffraction profiles in precision lattice parameter measurements according to the BOND-method are investigated. The use of a polynomial approximation with reciprocal measuring val