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Application of a precise double X-ray spectrometer for accurate lattice parameter determination

✍ Scribed by Godwod, K. ;Kowalczyk, R. ;Szmid, Z.

Publisher
John Wiley and Sons
Year
1974
Tongue
English
Weight
393 KB
Volume
21
Category
Article
ISSN
0031-8965

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A system of two crystal spectrometers for accurate wavelength measurements of hard X-rays emitted by heavy ions in flight is presently being completed. The configuration is working in the focusing compensated asymmetric laue (FOCAL) mode along with high performance two-dimensional position sensitive