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Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination

✍ Scribed by Härtwig, J. ;Hölzer, G. ;Förster, E. ;Goetz, K. ;Wokulska, K. ;Wolf, J.

Publisher: John Wiley and Sons
Year: 1994
Tongue: English
Weight: 650 KB
Volume: 143
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211430104

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