Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry

✍ Scribed by E. Schafler; G. Steiner; E. Korznikova; M. Kerber; M.J. Zehetbauer

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 222 KB
• Volume: 410-411
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2005.08.070