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X-ray reflectometry of nanocomposite metal-dielectric films

✍ Scribed by A. P. Petrakov; L. N. Kotov; Yu. E. Kalinin; A. V. Sitnikov

Book ID
110166667
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
166 KB
Volume
45
Category
Article
ISSN
0020-1685

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