✦ LIBER ✦

X-ray reflectometry and its application to studying the laser evaporation of an oxide film from the silicon surface

✍ Scribed by A. P. Petrakov

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Growth of an oxide film on a clean silic

✍ A.A. Frantsuzov; I.I. Makrushin 📂 Article 📅 1976 🏛 Elsevier Science 🌐 English ⚖ 265 KB

Model approach to solving the inverse pr

✍ Yu. O. Volkov, I. V. Kozhevnikov, B. S. Roshchin, E. O. Filatova, V. E. Asadchik 📂 Article 📅 2013 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 264 KB

X-ray scattering from surfaces and inter

✍ J. Harada; I. Takahashi; Y. Itoh; N.S. Sokolov; N.L. Yakovlev; Y. Shusterman; J. 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 734 KB

A Statistical Method for Studying the Ra

✍ Alois F. Kovarik 📂 Article 📅 1920 🏛 National Academy of Sciences 🌐 English ⚖ 129 KB

Studies of Cu-ZSM-5 by X-ray absorption

✍ Norma B. Castagnola; A. Jeremy Kropf; Christopher L. Marshall 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 908 KB

The x-ray excited-optical luminescence o

✍ DeKalb, Edward L.; Fassel, Velmer A. 📂 Article 📅 1975 🏛 American Chemical Society 🌐 English ⚖ 341 KB