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X-ray reflectometer for study of polymer thin films and interfaces

✍ Scribed by M. Foster; M. Stamm; G. Reiter

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 367 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93984-q

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