Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films

✍ Scribed by C.-H Lee; K.-L Yu; J.C.A Huang; G Felcher

• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 98 KB
• Volume: 60
• Category: Article
• ISSN: 0022-3697
• DOI: 10.1016/s0022-3697(99)00151-1