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On the use of specular neutron reflection in the study of roughness and interdiffusion in thin-film structures

✍ Scribed by N.K. Pleshanov; V.M. Pusenkov; A.F. Schebetov; B.G. Peskov; G.E. Shmelev; E.V. Siber; Z.N. Soroko

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 278 KB
Volume: 198
Category: Article
ISSN: 0921-4526
DOI: 10.1016/0921-4526(94)90119-8

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