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X-ray photoelectron spectroscopy study of Sn+ implanted a-Si1 − xCx:H thin films

✍ Scribed by N. Tzenov; D. Dimova-Malinovska; Ts. Marinova; V. Krastev; T. Tsvetkova

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
448 KB
Volume
29
Category
Article
ISSN
0921-5107

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