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X-ray photoelectron spectroscopy study of oxide and Te overlayers on as-grown and etched HgCdTe

✍ Scribed by L. S. Hirsch; R. Haakenaasen; T. Colin; K. S. Ziemer; C. D. Stinespring; S. Lovold; T. H. Myers

No coin nor oath required. For personal study only.

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