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X-ray photoelectron spectroscopy of thermally treated silica (SiO2) surfaces

✍ Scribed by Miller, Mark L.; Linton, Richard W.

Book ID: 121278404
Publisher: American Chemical Society
Year: 1985
Tongue: English
Weight: 751 KB
Volume: 57
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac00289a033

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