X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface

✍ Scribed by King, Sean W. ;French, Marc ;Jaehnig, Milt ;Kuhn, Markus ;Boyanov, Boyan ;French, Benjamin

• Book ID: 125961033
• Publisher: AVS (American Vacuum Society)
• Year: 2011
• Tongue: English
• Weight: 842 KB
• Volume: 29
• Category: Article
• ISSN: 1520-8567
• DOI: 10.1116/1.3633691