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A novel x-ray photoelectron spectroscopy study of the Al/SiO2 interface

✍ Scribed by Hecht, M. H.; Vasquez, R. P.; Grunthaner, F. J.; Zamani, N.; Maserjian, J.

Book ID: 120786022
Publisher: American Institute of Physics
Year: 1985
Tongue: English
Weight: 773 KB
Volume: 57
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.335266

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