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X-ray photoelectron spectroscopy analysis of a Cr-CrOx multilayer electrogalvanized coating

✍ Scribed by C. Battistoni; G. Mattogno; E. Paparazzo; G.M. Ingo

Book ID
107929914
Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
545 KB
Volume
29
Category
Article
ISSN
0257-8972

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## X-ray photoelectron spectra of two Ta-Ti bilayers on a Si wafer are measured using a soft x-ray synchrotron radiation beamline at the Photon Factory. The grazing incident x-rays are used to excite photoelectrons. The photoelectron intensity dependence is measured as the change in the glancing an