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X-ray photoelectron spectroscopic analysis of the surface chemistry of silica nanowires

✍ Scribed by Miles F. Beaux II; Nathan J. Bridges; Morgan DeHart; Thomas E. Bitterwolf; David N. McIlroy

Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
680 KB
Volume
257
Category
Article
ISSN
0169-4332

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## Abstract X‐ray photoelectron spectroscopy (XPS) has been used to probe the nature of silk fibroin surface, in particular the tyrosine content and sulfur species on the surface. The iodine labelling treatment of silk, followed by XPS surface analysis, reveals that silk fibroin has a tyrosine‐enri