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X-ray microanalysis of thin film layered specimens containing light elements

✍ Scribed by Rickerby, David G. ;Thiot, Jean-Fran�ois

Publisher: Springer-Verlag
Year: 1994
Weight: 680 KB
Volume: 114-115
Category: Article
ISSN: 0344-838X
DOI: 10.1007/bf01244569

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