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A comparison of ZAF-correction methods in quantitative X-ray microanalysis of light-element specimens

✍ Scribed by A. Boekestein; A.M. Stadhouders; A.L.H. Stols; G.M. Roomans

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 255 KB
Volume: 12
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(83)90306-6

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