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X-ray measurement of deformation and dislocation density in semiconductor strained layers

✍ Scribed by R. Beanland

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 874 KB
Volume: 130
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(93)90525-2

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