✦ LIBER ✦
Calculation of critical-layer-thickness and strain relaxation in GexSi1−x strained layers with interacting 60 and 90° dislocations
✍ Scribed by Uma Jain; S.C. Jain; J. Nijs; J.R. Willis; R. Bullough; R.P. Mertens; R. Van Overstraeten
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 699 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0038-1101
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