๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

X-ray investigation of TI-2201 single crystals with different Tc, 30 and 110K

โœ Scribed by V.N. Molchanov; R.A. Tamarzyan; V.I. Simonov

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
314 KB
Volume
235-240
Category
Article
ISSN
0921-4534

No coin nor oath required. For personal study only.

โœฆ Synopsis

Crystal structure of tetragonal single crystals of'1"1-2201 have been determined by X-ray diffraction technique. Structural parameters of TI-2201 crystals with various T~ have been compawxL It was shown that T. variation is accompanied by changes in Cu-O bonds and the distance between Ba and the CuO2 plane.

๐Ÿ“œ SIMILAR VOLUMES

X-Ray Topographic Investigation of Silic
X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb
โœ Prof. Dr. sc. S. S. Gorelik; Dr. V. T. Bublik; M. A. Khatsernov; Dr. I. N. Voron ๐Ÿ“‚ Article ๐Ÿ“… 1972 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 620 KB

Moscow Institnte oe Steel iind Alloys State research and project Institute of tho r&m-nirtale Industry Podolsk chemical and metalliirgical works ## X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb Heavily Sb dopcd silicon crystals grown by Czochralski mcthod were i