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Investigation of shallow strain distributions in silicon single crystals with X-ray bragg reflection

✍ Scribed by Dr. P. Zaumseil; Dipl.-Phys. U. Winter

Publisher: John Wiley and Sons
Year: 1983
Tongue: English
Weight: 448 KB
Volume: 18
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170180216

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