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X-ray interferometry study of deformation fields in silicon crystals, induced by a constant magnetic field

โœ Scribed by Drmeyan, G. R.; Aboyan, A. O.; Movcicyan, A. A.


Book ID
121539717
Publisher
Pleiades Publishing
Year
2013
Tongue
English
Weight
427 KB
Volume
7
Category
Article
ISSN
1027-4510

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