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X-ray interferometric investigation of deformation fields in ion-implanted silicon crystals

✍ Scribed by H. R. Drmeyan; A. H. Aboyan; F. H. Eyramjyan


Book ID
110203362
Publisher
Pleiades Publishing
Year
2011
Tongue
English
Weight
575 KB
Volume
5
Category
Article
ISSN
1027-4510

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