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X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

✍ Scribed by A. Hesse; Y. Zhuang; V. Holý; J. Stangl; S. Zerlauth; F. Schäffler; G. Bauer; N. Darowski; U. Pietsch

No coin nor oath required. For personal study only.

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