<p><P>This monograph represents a critical survey of the outstanding capabilities of X-ray <BR>diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particula
X-Ray Diffuse Scattering from Self-Org. Mesoscopic Semicond. Structs
โ Scribed by M. Schmidbauer
- Publisher
- Springer
- Year
- 2004
- Tongue
- English
- Leaves
- 209
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of material
Welberry (chemistry, Australian National University) shows how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analyzed. Early chapters of the book describe the experimental methods used
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semic