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X-Ray Diffuse Scattering from Self-Org. Mesoscopic Semicond. Structs

โœ Scribed by M. Schmidbauer


Publisher
Springer
Year
2004
Tongue
English
Leaves
209
Category
Library

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๐Ÿ“œ SIMILAR VOLUMES


X-Ray Diffuse Scattering from Self-Organ
โœ Dr. Martin Schmidbauer (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2004 ๐Ÿ› Springer-Verlag Berlin Heidelberg ๐ŸŒ English

<p><P>This monograph represents a critical survey of the outstanding capabilities of X-ray <BR>diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particula

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Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the basic structural characteristics of material

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Welberry (chemistry, Australian National University) shows how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analyzed. Early chapters of the book describe the experimental methods used

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