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X-ray diffractometry and electron microscopy of porous silicon layers at different stages of oxidation in air

โœ Scribed by V. V. Ratnikov; L. M. Sorokin; V. I. Sokolov; A. E. Kalmykov


Book ID
111446719
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
249 KB
Volume
51
Category
Article
ISSN
1063-7834

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