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Oxidation of etched silicon in air at room temperature; measurements with ultrasoft x-ray photoelectron spectroscopy (ESCA) and neutron activation analysis

✍ Scribed by G. Mende; J. Finster; D. Flamm; D. Schulze


Publisher
Elsevier Science
Year
1983
Weight
60 KB
Volume
128
Category
Article
ISSN
0167-2584

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