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X-ray diffractometer control of film and foil thickness

✍ Scribed by O. K. Kolerov; A. N. Logvinov; M. I. Mishin; V. G. Skryabin; V. D. Yushin

Publisher
Springer US
Year
1984
Tongue
English
Weight
207 KB
Volume
27
Category
Article
ISSN
0543-1972

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## Abstract Nanoparticle tungsten trioxide thick films based on commercial WO~3~ nanopowder and powder mixtures with different concentrations of metals (Ag, In and Bi) were prepared by screen‐printing onto alumina substrates. The changes in phase composition, crystallite size and cell parameters in