𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A New X-Ray Diffraction Method for Thin Film Thickness Estimation

✍ Scribed by Hejdová, H. ;Čermák, M.

Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
155 KB
Volume
72
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

New x-ray diffraction method of addition
New x-ray diffraction method of additions for crystalline silica
✍ Jacques Renault; Chris McKee; James Barker 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 516 KB

Abstmet A new method of additions is described for x-ray diffraction determination of trace crystalline silica. The method is derived from Klug and Alexander, X-ray Diffraction Procedures (Wiley, 1974, p. 536, Bqn. 7-14) and is expressed as x = sR,(l -R,)/(R, -Rx) where x and s are the concentration

X-ray Rotation-Tilt-Method — First Resul
X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique
✍ J. Bauch; H.-J. Ullrich; D. Reiche 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 671 KB

That from us as X-ray Rotation-Tilt Technique (XRT Method) designated procedure principle represents a world innovation and overcomes essential disadvantages of comparable diffraction techniques known up to now. Starting from the origin and the informational content of the XRT interferences a realiz