✦ LIBER ✦

New x-ray diffraction method of additions for crystalline silica

✍ Scribed by Jacques Renault; Chris McKee; James Barker

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 516 KB
Volume: 286
Category: Article
ISSN: 0003-2670
DOI: 10.1016/0003-2670(94)80185-1

No coin nor oath required. For personal study only.

✦ Synopsis

Abstmet A new method of additions is described for x-ray diffraction determination of trace crystalline silica. The method is derived from Klug and Alexander, X-ray Diffraction Procedures (Wiley, 1974, p. 536, Bqn. 7-14) and is expressed as x = sR,(l -R,)/(R, -Rx) where x and s are the concentrations of analyte and spike, and R, and R, are the relative intensities of analyte and spike. The method is particularly attractive because the mass absorption coefficient of the matrix can be very different from silica, and large spikes can be used which minimize homogenization errors. In addition, non-zero intercepts are avoided. Trace determination of quartz at the < 0.1 wt.% level can be routinely accomplished by using the new method with rotating pressed-powder briquettes and a peak deconvolution strategy due to Wiedemann et al. [Powder Diffraction, 2 (1987a, b) 130, 137.1.

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