## Abstract There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are
X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique
✍ Scribed by J. Bauch; H.-J. Ullrich; D. Reiche
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 671 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
✦ Synopsis
That from us as X-ray Rotation-Tilt Technique (XRT Method) designated procedure principle represents a world innovation and overcomes essential disadvantages of comparable diffraction techniques known up to now. Starting from the origin and the informational content of the XRT interferences a realization of a special equipment and selected examples of some first applications are presented.
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