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A comparison of the KOSSEL and the X-ray Rotation-Tilt Technique

✍ Scribed by J. Bauch; H.-J. Ullrich; M. Böhling; D. Reiche

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
760 KB
Volume
38
Category
Article
ISSN
0232-1300

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✦ Synopsis

Abstract

There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are compared to show their possibilities and limitations. Some selected examples of new applications are presented.

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