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X-ray diffraction study of silicon single crystals highly doped with boron

✍ Scribed by I. L. Shul’pina; S. S. Rouvimov; R. N. Kyutt


Book ID
110203180
Publisher
Pleiades Publishing
Year
2010
Tongue
English
Weight
311 KB
Volume
4
Category
Article
ISSN
1027-4510

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Moscow Institnte oe Steel iind Alloys State research and project Institute of tho r&m-nirtale Industry Podolsk chemical and metalliirgical works ## X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb Heavily Sb dopcd silicon crystals grown by Czochralski mcthod were i