X-ray diffraction diagnostics methods as applied to highly doped semiconductor single crystals

✍ Scribed by I. L. Shul’pina; R. N. Kyutt; V. V. Ratnikov; I. A. Prokhorov; I. Zh. Bezbakh; M. P. Shcheglov

• Book ID: 111448779
• Publisher: Springer
• Year: 2010
• Tongue: English
• Weight: 293 KB
• Volume: 55
• Category: Article
• ISSN: 1063-7842
• DOI: 10.1134/s1063784210040183