✦ LIBER ✦

X-ray diffraction study of defects in zinc-diffusion-doped silicon

✍ Scribed by Privezentsev, V. V.

Book ID: 121584114
Publisher: SP MAIK Nauka/Interperiodica
Year: 2013
Tongue: English
Weight: 229 KB
Volume: 58
Category: Article
ISSN: 1063-7745
DOI: 10.1134/S1063774513070134

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Defect structure of zinc doped silicon s

Defect structure of zinc doped silicon studied by X-ray diffuse scattering method

✍ Kirill D. Shcherbachev; Vladimir V. Privezentsev 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 358 KB

X-ray diffraction study of defect distri

X-ray diffraction study of defect distribution in Czochralski grown silicon highly doped by As

✍ Kyutt, R N; Shulpina, I L; Mosina, G N; Ratnikov, V V; Sorokin, L M; Scheglov, M 📂 Article 📅 2005 🏛 Institute of Physics 🌐 English ⚖ 220 KB

X-ray diffraction study of doped polyani

X-ray diffraction study of doped polyaniline

✍ H. K. Chaudhari; D. S. Kelkar 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 299 KB 👁 2 views

Polyaniline (PAn), a n important conducting polymer, was synthesized chemically. Percentage crystallinity of' PAn on doping with various dopants (viz., hydrochloric acid, formic acid, iodine, methylene blue) has been investigated using wide-angle X-ray diffraction analysis. It is observed that perce

X-ray diffraction study of silicon singl

X-ray diffraction study of silicon single crystals highly doped with boron

✍ I. L. Shul’pina; S. S. Rouvimov; R. N. Kyutt 📂 Article 📅 2010 🏛 Pleiades Publishing 🌐 English ⚖ 311 KB

X-ray diffraction studies of porous sili

X-ray diffraction studies of porous silicon

✍ Daniel Bellet; Gérard Dolino 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 784 KB

An X-ray diffraction study of liquid zin

An X-ray diffraction study of liquid zinc

✍ G. Etherington; C.N.J. Wagner 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 190 KB