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X-ray diffraction studies of silicon implanted with high-energy erbium ions

✍ Scribed by R. N. Kyutt; N. A. Sobolev

Book ID: 110118062
Publisher: SP MAIK Nauka/Interperiodica
Year: 1997
Tongue: English
Weight: 110 KB
Volume: 39
Category: Article
ISSN: 1063-7834
DOI: 10.1134/1.1129963

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